Hendrikse, A.J. (2012) SOS, lost in a high dimensional space. PhD thesis, Univ. of Twente. CTIT Ph.D.-thesis series no. 11-223 ISBN 978-90-365-3367-6

Spreeuwers, L.J. and Hendrikse, A.J. and Gerritsen, K.J. (2012) Evaluation of automatic face recognition for automatic border control on actual data recorded of travellers at Schiphol Airport. In: 2012 BIOSIG - Proceedings of the International Conference of Biometrics Special Interest Group, 6-7 Sept. 2012, Darmstadt, Germany. pp. 1-6. Proceedings of the International Conference of Biometrics Special Interest Group. Gesellschaft für Informatik e.V.. ISSN 1617-5468 ISBN 978-1-4673-1010-9

van Bloem, J.W.H. and Hendrikse, A.J. and Schiphorst, R. and Slump, C.H. (2011) An eigenvalue approach to enhance energy detection in a mobile spectrum monitoring network. In: 5th International Conference on Signal Processing and Communication Systems, ICSPCS 2011, 12-14 Dec 2011, Honolulu, HI, USA. pp. 1-6. IEEE Signal Processing Society. ISBN 978-1-4577-1179-4

Hendrikse, A.J. and Veldhuis, R.N.J. and Spreeuwers, L.J. (2010) The effect of position sources on estimated eigenvalues in intensity modeled data. In: Thirty-first Symposium, 11-12 May 2010, Rotterdam, the Netherlands. pp. 105-112. Werkgemeenschap voor Informatie- en Communicatietheorie. ISBN 978-90-710-4823-4

Hendrikse, A.J. and Veldhuis, R.N.J. and Spreeuwers, L.J. (2010) Verification Under Increasing Dimensionality. In: 20th International Conference on Pattern Recognition (ICPR 2010), 23-26 Aug 2010, Istanbul, Turky. pp. 589-592. IEEE Computer Society. ISSN 1051-4651 ISBN 978-0-7695-4109-9

Hendrikse, A.J. and Spreeuwers, L.J. and Veldhuis, R.N.J. (2009) A Bootstrap Approach to Eigenvalue Correction. In: Ninth IEEE International Conference on Data Mining, 2009. ICDM '09., 6-9 Dec. 2009, Miami Beach, FL, USA. pp. 818-823. IEEE Computer Society. ISSN 1550-4786 ISBN 978-1-4244-5242-2

Hendrikse, A.J. and Veldhuis, R.N.J. and Spreeuwers, L.J. (2009) Improved variance estimation along sample eigenvectors. In: Proceedings of the 30th Symposium on Information Theory in the Benelux, 28-29 May 2009, Eindhoven, The Netherlands. pp. 25-32. Werkgemeenschap voor Informatie- en Communicatietheorie. ISBN 978-90-386-1852-4

Hendrikse, A.J. and Veldhuis, R.N.J. and Spreeuwers, L.J. and Bazen, A.M. (2009) Analysis of eigenvalue correction applied to biometrics. In: Advances in Biometrics, 02-05 June 2009, Alghero, Italy. pp. 189-198. Lecture Notes in Computer Science 5558/2009. Springer Verlag. ISSN 0302-9743 ISBN 978-3-642-01792-6

Hendrikse, A.J. and Veldhuis, R.N.J. and Spreeuwers, L.J. (2008) Eigenvalue correction results in face recognition. In: Proceedings of the 29th Symposium on Information Theory in the Benelux, 29-30 May 2008, Leuven, Belgium. pp. 27-35. wic. ISBN 978-90-9023135-8

Hendrikse, A.J. and Veldhuis, R.N.J. and Spreeuwers, L.J. (2007) Component ordering in independent component analysis based on data power. In: Proceedings of the 28th Symposium on Information Theory in the Benelux, 24-25 May 2007, Enschede, The Netherlands. pp. 211-218. Werkgemeenschap voor Informatie- en Communicatietechniek. ISBN 978-90-365-2509-1

Hendrikse, A.J. (2006) FRICA, face recognition with independent component analysis. Master's thesis, University of Twente.

Veldhuis, R.N.J. and Bazen, A.M. and Booij, W.D.T. and Hendrikse, A.J. (2006) Hand-geometry recognition based on contour landmarks. In: Proceedings of the 29th Annual Conference of the Gesellschaft fur Klassifikation e.V., 09-11 Mar 2005, Magdeburg, Germany. pp. 646-653. Studies in classification, data analysis, and knowledge organisation. Springer Verlag. ISBN 978-3-540-31313-7

Veldhuis, R.N.J. and Bazen, A.M. and Booij, W.D.T. and Hendrikse, A.J. (2005) Hand-Geometry Recognition Based on Contour Parameters. In: SPIE Biometric Technology for Human Identification II, Orlando, FL, USA. pp. 344-353. SPIE -- The Int. Society for Optical Engineering. ISBN 0-8194-5764-7

Veldhuis, R.N.J. and Bazen, A.M. and Booij, W.D.T. and Hendrikse, A.J. (2004) A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. In: 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC), Veldhoven, The Netherlands. pp. 326-330. Technology Foundation STW. ISBN 90-73461-43-X